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Wei-Hen Lo, Ang-Chih Hsieh, Chien-Ming Lan, Min-Hsien Lin, TingTing Hwang. Utilizing circuit structure for scan chain diagnosis. In 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013. pages 1-6, IEEE Computer Society, 2013. [doi]

This author has not been identified. Look up 'Wei-Hen Lo' in GoogleThis author has not been identified. Look up 'Ang-Chih Hsieh' in GoogleThis author has not been identified. Look up 'Chien-Ming Lan' in GoogleThis author has not been identified. Look up 'Min-Hsien Lin' in GoogleThis author has not been identified. Look up 'TingTing Hwang' in Google

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