Wei-Hen Lo, Ang-Chih Hsieh, Chien-Ming Lan, Min-Hsien Lin, TingTing Hwang. Utilizing circuit structure for scan chain diagnosis. In 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013. pages 1-6, IEEE Computer Society, 2013. [doi]
@inproceedings{LoHLLH13,
title = {Utilizing circuit structure for scan chain diagnosis},
author = {Wei-Hen Lo and Ang-Chih Hsieh and Chien-Ming Lan and Min-Hsien Lin and TingTing Hwang},
year = {2013},
doi = {10.1109/ETS.2013.6569355},
url = {http://doi.ieeecomputersociety.org/10.1109/ETS.2013.6569355},
researchr = {https://researchr.org/publication/LoHLLH13},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-6376-1},
}