Utilizing circuit structure for scan chain diagnosis

Wei-Hen Lo, Ang-Chih Hsieh, Chien-Ming Lan, Min-Hsien Lin, TingTing Hwang. Utilizing circuit structure for scan chain diagnosis. In 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013. pages 1-6, IEEE Computer Society, 2013. [doi]

Abstract

Abstract is missing.