Thiago Berticelli Lo, Fernanda Lima Kastensmidt, Antonio Carlos Schneider Beck. Towards an adaptable bit-width NMR voter for multiple error masking. In 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014. pages 258-263, IEEE, 2014. [doi]
Abstract is missing.