Package-chip co-design to increase flip-chip C4 reliability

Sheldon Logan, Matthew R. Guthaus. Package-chip co-design to increase flip-chip C4 reliability. In Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011, Santa Clara, California, USA, 14-16 March 2011. pages 553-558, IEEE, 2011. [doi]

Abstract

Abstract is missing.