Detection of Temperature Sensitive Defects Using ZTC

Ethan Long, W. Robert Daasch, Robert Madge, Brady Benware. Detection of Temperature Sensitive Defects Using ZTC. In 22nd IEEE VLSI Test Symposium (VTS 2004), 25-29 April 2004, Napa Valley, CA, USA. pages 185-192, IEEE Computer Society, 2004. [doi]

Authors

Ethan Long

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W. Robert Daasch

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Robert Madge

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Brady Benware

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