Optimization of the bias current network for accurate on-chip thermal monitoring

Jieyi Long, Seda Ogrenci Memik. Optimization of the bias current network for accurate on-chip thermal monitoring. In Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010. pages 1365-1368, IEEE, 2010. [doi]

Authors

Jieyi Long

This author has not been identified. Look up 'Jieyi Long' in Google

Seda Ogrenci Memik

This author has not been identified. Look up 'Seda Ogrenci Memik' in Google