Jieyi Long, Seda Ogrenci Memik. Optimization of the bias current network for accurate on-chip thermal monitoring. In Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010. pages 1365-1368, IEEE, 2010. [doi]
@inproceedings{LongM10-0,
title = {Optimization of the bias current network for accurate on-chip thermal monitoring},
author = {Jieyi Long and Seda Ogrenci Memik},
year = {2010},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5457023},
tags = {optimization},
researchr = {https://researchr.org/publication/LongM10-0},
cites = {0},
citedby = {0},
pages = {1365-1368},
booktitle = {Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010},
publisher = {IEEE},
}