Branden Long, Saptarshi Mandal, Rashmi Jha, Alexander Pronin, Peter J. Hulbert. Understanding the impact of slow electro-forming in Resistive Random Access Memories. In IEEE 56th International Midwest Symposium on Circuits and Systems, MWSCAS 2013, Columbus, OH, USA, August 4-7, 2013. pages 85-88, IEEE, 2013. [doi]
Abstract is missing.