CNN Aided Surface Inspection for SMT Manufacturing

Mee Chun Loo, Rajasvaran Logeswaran, Zailan Arabee bin Abdul Salam. CNN Aided Surface Inspection for SMT Manufacturing. In 15th International Conference on Developments in eSystems Engineering, DeSE 2023, Baghdad & Anbar, Iraq, January 9-12, 2023. pages 328-332, IEEE, 2023. [doi]

Authors

Mee Chun Loo

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Rajasvaran Logeswaran

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Zailan Arabee bin Abdul Salam

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