Mee Chun Loo, Rajasvaran Logeswaran, Zailan Arabee bin Abdul Salam. CNN Aided Surface Inspection for SMT Manufacturing. In 15th International Conference on Developments in eSystems Engineering, DeSE 2023, Baghdad & Anbar, Iraq, January 9-12, 2023. pages 328-332, IEEE, 2023. [doi]
@inproceedings{LooLS23, title = {CNN Aided Surface Inspection for SMT Manufacturing}, author = {Mee Chun Loo and Rajasvaran Logeswaran and Zailan Arabee bin Abdul Salam}, year = {2023}, doi = {10.1109/DeSE58274.2023.10099694}, url = {https://doi.org/10.1109/DeSE58274.2023.10099694}, researchr = {https://researchr.org/publication/LooLS23}, cites = {0}, citedby = {0}, pages = {328-332}, booktitle = {15th International Conference on Developments in eSystems Engineering, DeSE 2023, Baghdad & Anbar, Iraq, January 9-12, 2023}, publisher = {IEEE}, isbn = {979-8-3503-3514-9}, }