Mee Chun Loo, Rajasvaran Logeswaran, Zailan Arabee bin Abdul Salam. CNN Aided Surface Inspection for SMT Manufacturing. In 15th International Conference on Developments in eSystems Engineering, DeSE 2023, Baghdad & Anbar, Iraq, January 9-12, 2023. pages 328-332, IEEE, 2023. [doi]
Abstract is missing.