Omar López-L, I. Martínez, D. Durini, E. A. Gutiéirrez-D, D. Ferrusca, M. Velázquez, F. J. De la Hidalga, V. Gómez. A Performance Comparative at Low Temperatures of Two FET Technologies: 65 nm and 14 nm. In 17th International Conference on Electrical Engineering, Computing Science and Automatic Control, CCE 2020, Mexico City, Mexico, November 11-13, 2020. pages 1-4, IEEE, 2020. [doi]
Abstract is missing.