Investigating Manufacturing Defects Leading to Potential Silent Data Errors

Jorge Lopez, VĂ­ctor H. Champac. Investigating Manufacturing Defects Leading to Potential Silent Data Errors. In 26th IEEE Latin American Test Symposium, LATS 2025, San Andres Islas, Colombia, March 11-14, 2025. pages 1-6, IEEE, 2025. [doi]

Abstract

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