J. Minguet Lopez, L. Hudeley, L. Grenouillet, Diego Alfaro Robayo, J. Sandrini, G. Navarro, Mathieu Bernard, C. Carabasse, Damien Deleruyelle, Niccolo Castellani, Marc Bocquet, Jean Michel Portal, Etienne Nowak, Gabriel Molas. Elucidating 1S1R operation to reduce the read voltage margin variability by stack and programming conditions optimization. In IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021. pages 1-6, IEEE, 2021. [doi]
Abstract is missing.