Felipe Lopez, Miguel Saez, Yuru Shao, Efe C. Balta, James Moyne, Z. Morley Mao, Kira Barton, Dawn Tilbury. Categorization of Anomalies in Smart Manufacturing Systems to Support the Selection of Detection Mechanisms. IEEE Robotics and Automation Letters, 2(4):1885-1892, 2017. [doi]
Abstract is missing.