Christian Lotto, Peter Seitz, Thomas Baechler. A sub-electron readout noise CMOS image sensor with pixel-level open-loop voltage amplification. In IEEE International Solid-State Circuits Conference, ISSCC 2011, Digest of Technical Papers, San Francisco, CA, USA, 20-24 February, 2011. pages 402-404, IEEE, 2011. [doi]
Abstract is missing.