Wenzhong Lou, Renlong Song, Yunjian Liu, Xiaosong Liu, Weihua Li, Wanfeng Lin. A novel multi-direction high shock reliability test on MEMS devices. In 4th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, IEEE-NEMS 2009, Shenzhen, China, January 5-8, 2009. pages 261-264, IEEE, 2009. [doi]
@inproceedings{LouSLLLL09, title = {A novel multi-direction high shock reliability test on MEMS devices}, author = {Wenzhong Lou and Renlong Song and Yunjian Liu and Xiaosong Liu and Weihua Li and Wanfeng Lin}, year = {2009}, doi = {10.1109/NEMS.2009.5068573}, url = {http://doi.ieeecomputersociety.org/10.1109/NEMS.2009.5068573}, tags = {testing, reliability}, researchr = {https://researchr.org/publication/LouSLLLL09}, cites = {0}, citedby = {0}, pages = {261-264}, booktitle = {4th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, IEEE-NEMS 2009, Shenzhen, China, January 5-8, 2009}, publisher = {IEEE}, isbn = {978-1-4244-4629-2}, }