Sequential equivalence checking based on k-th invariants and circuit SAT solving

Feng Lu, Kwang-Ting (Tim) Cheng. Sequential equivalence checking based on k-th invariants and circuit SAT solving. In Tenth IEEE International High-Level Design Validation and Test Workshop 2005, Napa Valley, CA, USA, November 30 - December 2, 2005. pages 45-51, IEEE Computer Society, 2005. [doi]

Abstract

Abstract is missing.