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Re-sequencing ECC and Built-In Self-Repair with In-Page Fault Scrambling for Enhancing Yield and Reliability of Flash Memory

Shyue-Kung Lu, Qian-Rui Dong. Re-sequencing ECC and Built-In Self-Repair with In-Page Fault Scrambling for Enhancing Yield and Reliability of Flash Memory. In IEEE European Test Symposium, ETS 2026, Chania, Greece, May 25-29, 2026. pages 1-4, IEEE, 2026. [doi]

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