Retention-Aware Refresh Techniques for Reducing Power and Mitigation of Data Retention Faults in DRAM

Shyue-Kung Lu, Hung-Kai Huang, Chun-Lung Hsu, Chi-Tien Sun, Kohei Miyase. Retention-Aware Refresh Techniques for Reducing Power and Mitigation of Data Retention Faults in DRAM. J. Electronic Testing, 35(4):485-495, 2019. [doi]

Abstract

Abstract is missing.