Exploring linear structures of critical path delay faults to reduce test efforts - researchr publication authors

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Shun-Yen Lu, Pei-Ying Hsieh, Jing-Jia Liou. Exploring linear structures of critical path delay faults to reduce test efforts. In Soha Hassoun, editor, 2006 International Conference on Computer-Aided Design (ICCAD 06), November 5-9, 2006, San Jose, CA, USA. pages 100-106, ACM, 2006. [doi]

This author has not been identified. Look up 'Shun-Yen Lu' in GoogleThis author has not been identified. Look up 'Pei-Ying Hsieh' in GoogleThis author has not been identified. Look up 'Jing-Jia Liou' in Google

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