Exploring linear structures of critical path delay faults to reduce test efforts

Shun-Yen Lu, Pei-Ying Hsieh, Jing-Jia Liou. Exploring linear structures of critical path delay faults to reduce test efforts. In Soha Hassoun, editor, 2006 International Conference on Computer-Aided Design (ICCAD 06), November 5-9, 2006, San Jose, CA, USA. pages 100-106, ACM, 2006. [doi]

Abstract

Abstract is missing.