An enhanced built-in self-repair technique for yield and reliability improvement of embedded memories - researchr publication authors

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Shyue-Kung Lu, Hao-Wei Lin, Masaki Hashizume. An enhanced built-in self-repair technique for yield and reliability improvement of embedded memories. In 2015 IEEE 11th International Conference on ASIC, ASICON 2015, Chengdu, China, November 3-6, 2015. pages 1-4, IEEE, 2015. [doi]

This author has not been identified. Look up 'Shyue-Kung Lu' in GoogleThis author has not been identified. Look up 'Hao-Wei Lin' in GoogleThis author has not been identified. Look up 'Masaki Hashizume' in Google

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