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Fault-Aware Dependability Enhancement Techniques for Phase Change Memory

Shyue-Kung Lu, Hui-Ping Li, Kohei Miyase, Chun-Lung Hsu, Chi-Tien Sun. Fault-Aware Dependability Enhancement Techniques for Phase Change Memory. J. Electronic Testing, 37(4):503-513, 2021. [doi]

Authors

Shyue-Kung Lu

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Hui-Ping Li

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Kohei Miyase

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Chun-Lung Hsu

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Chi-Tien Sun

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