Fault-Aware Dependability Enhancement Techniques for Phase Change Memory

Shyue-Kung Lu, Hui-Ping Li, Kohei Miyase, Chun-Lung Hsu, Chi-Tien Sun. Fault-Aware Dependability Enhancement Techniques for Phase Change Memory. J. Electronic Testing, 37(4):503-513, 2021. [doi]

Abstract

Abstract is missing.