Longest path selection for delay test under process variation

Xiang Lu, Zhuo Li, Wangqi Qiu, D. M. H. Walker, Weiping Shi. Longest path selection for delay test under process variation. In Masaharu Imai, editor, Proceedings of the 2004 Conference on Asia South Pacific Design Automation: Electronic Design and Solution Fair 2004, Yokohama, Japan, January 27-30, 2004. pages 98-103, IEEE, 2004. [doi]

Abstract

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