Defect Level Prediction Using Multi-Model Fault Coverage

Shyue-Kung Lu, Tsung-Ying Lee, Cheng-Wen Wu. Defect Level Prediction Using Multi-Model Fault Coverage. In 8th Asian Test Symposium (ATS 99), 16-18 November 1999, Shanghai, China. pages 301, IEEE Computer Society, 1999. [doi]

Abstract

Abstract is missing.