Yichuan Lu, Kiruba S. Subramani, He Huang, Nathan Kupp, Ke Huang, Yiorgos Makris. A comparative study of one-shot statistical calibration methods for analog / RF ICs. In 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015. pages 1-10, IEEE, 2015. [doi]
@inproceedings{LuSHKHM15,
title = {A comparative study of one-shot statistical calibration methods for analog / RF ICs},
author = {Yichuan Lu and Kiruba S. Subramani and He Huang and Nathan Kupp and Ke Huang and Yiorgos Makris},
year = {2015},
doi = {10.1109/TEST.2015.7342415},
url = {http://dx.doi.org/10.1109/TEST.2015.7342415},
researchr = {https://researchr.org/publication/LuSHKHM15},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015},
publisher = {IEEE},
isbn = {978-1-4673-6578-9},
}