Yichuan Lu, Kiruba S. Subramani, He Huang, Nathan Kupp, Ke Huang, Yiorgos Makris. A comparative study of one-shot statistical calibration methods for analog / RF ICs. In 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015. pages 1-10, IEEE, 2015. [doi]
Abstract is missing.