IEEE 1149.1 Based Defect and Fault Tolerant Scan Chain for Wafer Scale Integration - researchr publication

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Meng Lu, Yvon Savaria, Bing Qiu, Jacques Taillefer. IEEE 1149.1 Based Defect and Fault Tolerant Scan Chain for Wafer Scale Integration. In 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings. pages 18-25, IEEE Computer Society, 2003. [doi]

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