Tiantao Lu, Caleb Serafy, Zhiyuan Yang, Ankur Srivastava. Voltage Noise Induced DRAM Soft Error Reduction Technique for 3D-CPUs. In Proceedings of the 2016 International Symposium on Low Power Electronics and Design, ISLPED 2016, San Francisco Airport, CA, USA, August 08 - 10, 2016. pages 82-87, ACM, 2016. [doi]
Abstract is missing.