Yinghai Lu, Li Shang, Hai Zhou, Hengliang Zhu, Fan Yang, Xuan Zeng. Statistical reliability analysis under process variation and aging effects. In Proceedings of the 46th Design Automation Conference, DAC 2009, San Francisco, CA, USA, July 26-31, 2009. pages 514-519, ACM, 2009. [doi]
Abstract is missing.