Shyue-Kung Lu, Shu-Chi Yu, Chun-Lung Hsu, Chi-Tien Sun, Masaki Hashizume, Hiroyuki Yotsuyanagi. Fault-Aware Dependability Enhancement Techniques for Flash Memories. IEEE Trans. VLSI Syst., 28(3):634-645, 2020. [doi]
@article{LuYHSHY20,
title = {Fault-Aware Dependability Enhancement Techniques for Flash Memories},
author = {Shyue-Kung Lu and Shu-Chi Yu and Chun-Lung Hsu and Chi-Tien Sun and Masaki Hashizume and Hiroyuki Yotsuyanagi},
year = {2020},
doi = {10.1109/TVLSI.2019.2957830},
url = {https://doi.org/10.1109/TVLSI.2019.2957830},
researchr = {https://researchr.org/publication/LuYHSHY20},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {28},
number = {3},
pages = {634-645},
}