Yufan Lu, Xiaojun Zhai, Sangeet Saha, Shoaib Ehsan, Klaus D. McDonald-Maier. A self-scrubbing scheme for embedded systems in radiation environments. In 26th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2020, Napoli, Italy, July 13-15, 2020. pages 1-4, IEEE, 2020. [doi]
Abstract is missing.