Monte Carlo Analysis of Measurement Uncertainties for On-Wafer Multiline TRL Calibration Including Dynamic Accuracy - researchr publication authors

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Peng Luan, Yibang Wang, Wei Zhao, Chen Liu, Faguo Liang, Aihua Wu 0007, Jing Du. Monte Carlo Analysis of Measurement Uncertainties for On-Wafer Multiline TRL Calibration Including Dynamic Accuracy. IEEE T. Instrumentation and Measurement, 69(11):8874-8880, 2020. [doi]

This author has not been identified. Look up 'Peng Luan' in GoogleThis author has not been identified. Look up 'Yibang Wang' in GoogleThis author has not been identified. Look up 'Wei Zhao' in GoogleThis author has not been identified. Look up 'Chen Liu' in GoogleThis author has not been identified. Look up 'Faguo Liang' in GoogleThis author has not been identified. Look up 'Aihua Wu 0007' in GoogleThis author has not been identified. Look up 'Jing Du' in Google

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