Peng Luan, Yibang Wang, Wei Zhao, Chen Liu, Faguo Liang, Aihua Wu 0007, Jing Du. Monte Carlo Analysis of Measurement Uncertainties for On-Wafer Multiline TRL Calibration Including Dynamic Accuracy. IEEE T. Instrumentation and Measurement, 69(11):8874-8880, 2020. [doi]
@article{LuanWZLLWD20,
title = {Monte Carlo Analysis of Measurement Uncertainties for On-Wafer Multiline TRL Calibration Including Dynamic Accuracy},
author = {Peng Luan and Yibang Wang and Wei Zhao and Chen Liu and Faguo Liang and Aihua Wu 0007 and Jing Du},
year = {2020},
doi = {10.1109/TIM.2020.2995970},
url = {https://doi.org/10.1109/TIM.2020.2995970},
researchr = {https://researchr.org/publication/LuanWZLLWD20},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {69},
number = {11},
pages = {8874-8880},
}