Marcelo Lubaszewski. Can Functional Test Achieve Low-cost Full Coverage of NoC Faults?. In Dimitris Gizopoulos, Susumu Horiguchi, Spyros Tragoudas, Mohammad Tehranipoor, editors, 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2009, 7-9 October 2009, Chicago, Illinois, USA. pages 224-224, IEEE Computer Society, 2009. [doi]
Abstract is missing.