Counterfeit Detection by Semiconductor Process Technology Inspection

Matthias Ludwig 0005, Ann-Christin Bette, Bernhard Lippmann, Georg Sigl. Counterfeit Detection by Semiconductor Process Technology Inspection. In IEEE European Test Symposium, ETS 2023, Venezia, Italy, May 22-26, 2023. pages 1-4, IEEE, 2023. [doi]

Abstract

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