Robert G. de Luna, Elmer P. Dadios, Argel A. Bandala, Ryan Rhay P. Vicerra. Tomato Fruit Image Dataset for Deep Transfer Learning-based Defect Detection. In 2019 IEEE International Conference on Cybernetics and Intelligent Systems (CIS) and IEEE Conference on Robotics, Automation and Mechatronics (RAM), Bangkok, Thailand, November 18-20, 2019. pages 356-361, IEEE, 2019. [doi]
Abstract is missing.