A Sub-200-mV Voltage-Scalable SRAM With Tolerance of Access Failure by Self-Activated Bitline Sensing

Shien-Chun Luo, Lih-Yih Chiou. A Sub-200-mV Voltage-Scalable SRAM With Tolerance of Access Failure by Self-Activated Bitline Sensing. IEEE Trans. on Circuits and Systems, 57-II(6):440-445, 2010. [doi]

Authors

Shien-Chun Luo

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Lih-Yih Chiou

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