A Sub-200-mV Voltage-Scalable SRAM With Tolerance of Access Failure by Self-Activated Bitline Sensing

Shien-Chun Luo, Lih-Yih Chiou. A Sub-200-mV Voltage-Scalable SRAM With Tolerance of Access Failure by Self-Activated Bitline Sensing. IEEE Trans. on Circuits and Systems, 57-II(6):440-445, 2010. [doi]

Abstract

Abstract is missing.