Tripping Characteristics of Residual Current Devices under Non-Sinusoidal Currents - researchr publication authors

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Xiang Luo, Ya-ping Du, Xinghua Wang 0002, Mingli Chen 0002. Tripping Characteristics of Residual Current Devices under Non-Sinusoidal Currents. In Annual Meeting of the IEEE Industry Applications Society, IAS 2010, Houston, TX, USA, 3-7 October, 2010, Proceedings. pages 1-6, IEEE, 2010. [doi]

This author has not been identified. Look up 'Xiang Luo' in GoogleThis author has not been identified. Look up 'Ya-ping Du' in GoogleThis author has not been identified. Look up 'Xinghua Wang 0002' in GoogleThis author has not been identified. Look up 'Mingli Chen 0002' in Google

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