Xiang Luo, Ya-ping Du, Xinghua Wang 0002, Mingli Chen 0002. Tripping Characteristics of Residual Current Devices under Non-Sinusoidal Currents. In Annual Meeting of the IEEE Industry Applications Society, IAS 2010, Houston, TX, USA, 3-7 October, 2010, Proceedings. pages 1-6, IEEE, 2010. [doi]
@inproceedings{LuoDWC10,
title = {Tripping Characteristics of Residual Current Devices under Non-Sinusoidal Currents},
author = {Xiang Luo and Ya-ping Du and Xinghua Wang 0002 and Mingli Chen 0002},
year = {2010},
doi = {10.1109/IAS.2010.5616786},
url = {http://dx.doi.org/10.1109/IAS.2010.5616786},
researchr = {https://researchr.org/publication/LuoDWC10},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {Annual Meeting of the IEEE Industry Applications Society, IAS 2010, Houston, TX, USA, 3-7 October, 2010, Proceedings},
publisher = {IEEE},
isbn = {978-1-4244-6393-0},
}