Yixin Luo, Saugata Ghose, Yu Cai, Erich F. Haratsch, Onur Mutlu. HeatWatch: Improving 3D NAND Flash Memory Device Reliability by Exploiting Self-Recovery and Temperature Awareness. In IEEE International Symposium on High Performance Computer Architecture, HPCA 2018, Vienna, Austria, February 24-28, 2018. pages 504-517, IEEE Computer Society, 2018. [doi]
@inproceedings{LuoGCHM18,
title = {HeatWatch: Improving 3D NAND Flash Memory Device Reliability by Exploiting Self-Recovery and Temperature Awareness},
author = {Yixin Luo and Saugata Ghose and Yu Cai and Erich F. Haratsch and Onur Mutlu},
year = {2018},
doi = {10.1109/HPCA.2018.00050},
url = {http://doi.ieeecomputersociety.org/10.1109/HPCA.2018.00050},
researchr = {https://researchr.org/publication/LuoGCHM18},
cites = {0},
citedby = {0},
pages = {504-517},
booktitle = {IEEE International Symposium on High Performance Computer Architecture, HPCA 2018, Vienna, Austria, February 24-28, 2018},
publisher = {IEEE Computer Society},
isbn = {978-1-5386-3659-6},
}