A comprehensive study of device variability of sub-5 nm nanosheet transistors and interplay with quantum confinement variation - researchr publication authors

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Haowen Luo, Ruihan Li, Xiangshui Miao, Xingsheng Wang. A comprehensive study of device variability of sub-5 nm nanosheet transistors and interplay with quantum confinement variation. Science in China Series F: Information Sciences, 66(2), February 2023. [doi]

This author has not been identified. Look up 'Haowen Luo' in GoogleThis author has not been identified. Look up 'Ruihan Li' in GoogleThis author has not been identified. Look up 'Xiangshui Miao' in GoogleThis author has not been identified. Look up 'Xingsheng Wang' in Google

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