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Origin of Coulomb blockade oscillations in single-electron transistors fabricated with granulated Cr/Cr::2::O::3:: resistive microstrips

Xiangning Luo, Alexei O. Orlov, Gregory L. Snider. Origin of Coulomb blockade oscillations in single-electron transistors fabricated with granulated Cr/Cr::2::O::3:: resistive microstrips. Microelectronics Journal, 36(3-6):308-312, 2005. [doi]

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