Hong Luo, Yu Wang 0002, Yu Cao, Yuan Xie, Yuchun Ma, Huazhong Yang. Temporal Performance Degradation under RTN: Evaluation and Mitigation for Nanoscale Circuits. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2012, Amherst, MA, USA, August 19-21, 2012. pages 183-188, IEEE, 2012. [doi]
Abstract is missing.