A New Optimal Test Node Selection Method for Analog Circuit

Hui Luo, Youren Wang, Hua Lin, Yuanyuan Jiang. A New Optimal Test Node Selection Method for Analog Circuit. J. Electronic Testing, 28(3):279-290, 2012. [doi]

Authors

Hui Luo

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Youren Wang

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Hua Lin

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Yuanyuan Jiang

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