Accurate and Fast Estimation of Junction Band-to-Band Leakage in Nanometer-Scale MOSFET - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Hong Luo, Huazhong Yang, Rong Luo. Accurate and Fast Estimation of Junction Band-to-Band Leakage in Nanometer-Scale MOSFET. In IEEE Asia Pacific Conference on Circuits and Systems 2006, APCCAS 2006, Singapore, 4-7 December 2006. pages 956-959, IEEE, 2006. [doi]

This author has not been identified. Look up 'Hong Luo' in GoogleThis author has not been identified. Look up 'Huazhong Yang' in GoogleThis author has not been identified. Look up 'Rong Luo' in Google

runs on WebDSL